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  3. Applications and Metrology at Nanometer Scale, Volume 1: Smart Materials, Electromagnetic Waves and Uncertainties

Applications and Metrology at Nanometer Scale, Volume 1: Smart Materials, Electromagnetic Waves and Uncertainties

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami, 1786306409, 9781786306401

10 $

English | 2021 | PDF

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Applications and Metrology at Nanometer Scale, Volume 1: Smart Materials, Electromagnetic Waves and Uncertainties